Showing 1 - 20 results of 43 for search 'IEEE Computer Society Test Technology Committee', query time: 0.80s Refine Results
  1. 1
    Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Book
  2. 2
    Curriculum for test technology /
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  3. 3
    Digest of papers
    Published 1979
    “...IEEE Computer Society Test Technology Committee...”

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Conference Proceeding
  4. 4
    Digest of papers /
    Published 1979
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  5. 5
    Digest of papers ... Test Conference
    Published 1979
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  6. 6
    Digest of papers ... Semiconductor Test Conference
    Published 1978
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  7. 7
    Digest of papers
    Published 1981
    “...IEEE Computer Society Test Technology Committee...”

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Conference Proceeding
  8. 8
    Digest of papers /
    Published 1978
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  9. 9
    Proceedings /
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  10. 10
    Proceedings
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  11. 11
    Proceedings /
    Published 1986
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  12. 12
    Digest of papers /
    Published 1981
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  13. 13
    International Test Conference 1983 proceedings : testing's changing role, October 18-20, 1983 /
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
  14. 14
    Digest of papers /
    Published 1981
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding
  15. 15
    Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
    Published 1981
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
  16. 16
    The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /
    Published 1984
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
  17. 17
    Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /
    Published 1983
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
  18. 18
    IEEE standard for boundary-scan-based stimulus of interconnections to passive and/or active components /
    Published 2012
    “...IEEE Computer Society Test Technology Committee...”

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Book
  19. 19
    Proceedings, IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California /
    Published 1986
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
  20. 20
    Proceedings /
    Published 1986
    “...IEEE Computer Society Test Technology Committee...”

    Conference Proceeding Book
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