Showing 1 - 9 results of 9 for search 'Linholm, Loren W.', query time: 0.10s Refine Results
  1. 1
    CMOS/SOS test patterns for process evaluation and control : annual report, March 1 to November 1, 1978 /
    Other Authors: “...Linholm, Loren W...”

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Government Document Book
  2. 2
    The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control /
    by Linholm, Loren W, Linholm, Loren W.
    Published 1981
    Other Authors: “...Linholm, Loren W...”

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Government Document Book
  3. 3
    The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control /
    by Linholm, Loren W
    Published 1981

    Government Document Book
  4. 4
    The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control
    by Linholm, Loren W
    Published 1981

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Government Document Book
  5. 5
    Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /
    Other Authors: “...Linholm, Loren W...”

    Government Document Book
  6. 6
    Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /
    by Mitchell, Michael A
    Published 1981
    Other Authors: “...Linholm, Loren W...”

    Government Document Book
  7. 7
    Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /
    by Mitchell, Michael A
    Published 1981
    Other Authors: “...Linholm, Loren W...”

    Book
  8. 8
    An NMOS test chip for a course in semiconductor parameter measurements /
    by Roenker, K. P
    Published 1984
    Other Authors: “...Linholm, Loren W...”

    Government Document Book
  9. 9
    Evaluation of a CMOS/SOS process using process validation wafers /
    by Suehle, J. S (John S.)
    Published 1982
    Other Authors: “...Linholm, Loren W...”

    Government Document Book
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