Measurement of dielectric properties under space conditions : a symposium presented at the sixty-ninth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 26 June-1 July, 1966
| Corporate Authors: | , , |
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| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
West Conshohocken, Pa. :
ASTM International,
1967
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| Series: | Journal of American Society for Testing and Materials Selected technical papers ;
STP420. |
| Subjects: |