Digital System Verification : A Combined Formal Methods and Simulation Framework /

Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large designs before fabrication poses an extremely challenging problem. Formal verification validates...

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Bibliographic Details
Main Authors: Li, Lun (Author, http://id.loc.gov/vocabulary/relators/aut), Thornton, Mitchel (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2010
Edition:1st ed. 2010
Series:Synthesis Lectures on Digital Circuits & Systems,
Subjects:

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Duke University

Holdings details from Duke University
Call Number: ISIL:US-NCD