22nd IEEE VLSI Test Symposium proceedings : 25-29 April, 2004, Napa Valley, California /

22nd IEEE VLSI Test Symposium proceedings : 25-29 April, 2004, Napa Valley, California /

Show other versions (17)
Bibliographic Details
Corporate Authors: IEEE VLSI Test Symposium Napa Valley, Calif., IEEE Computer Society Test Technology Technical Committee, IEEE Xplore (Online service)
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, [2004]
Subjects:
Integrated circuits > Very large scale integration > Testing > Congresses
Integrated circuits > Very large scale integration > Testing
Conference papers and proceedings

Internet

This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.

Similar Items