Scanning probe microscopy : the lab on a tip /

This handbook is aimed at researchers and practitioners involved in surface science. The basics of the atomic force microscopy technique as well as material class-specific applications are thoroughly discussed. The book enables advanced students to access this material and allows researchers to deve...

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Bibliographic Details
Main Authors:	Meyer, E (Ernst), Meyer, E (Ernst), 1962-
Corporate Author:	Craig M. Merrihue Memorial Fund
Other Authors:	Bennewitz, Roland, 1967-, Hug, Hans J (Hans Josef), 1964-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, [2004], ©2004 Berlin ; New York : c2004 Berlin ; New York : [2004]
Series:	Advanced texts in physics, Advanced texts in physics Advanced texts in physics
Subjects:	Scanning probe microscopy Microscopy, Scanning Probe

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