Bibliographic Details
| Corporate Authors: |
Materials Research Society,
Materials Research Society Fall Meeting,
Symposium on the Characterization of Defects in Materials |
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| Other Authors: |
Siegel, R. W (Richard W),
Siegel, R. W (Richard W.),
Sinclair, R,
Sinclair, Robert,
Sinclair, Robert (Materials scientist),
Weertman, Julia R (Julia Randall) |
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| Format: | Conference Proceeding
Book
|
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| Language: | English |
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| Published: |
Pittsburgh, Pa. :
Materials Research Society,
[1987], ©1987
Pittsburgh, Pa. :
c1987
|
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| Series: | Materials Research Society symposia proceedings
v. 82
Materials Research Society symposia proceedings ;
v. 82
Materials Research Society symposia proceedings
v. 82
|
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| Subjects: |
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