Symposium on fluorescent X-ray spectrographic analysis; presented at the fifty-sixth annual meeting, American Society for Testing Materials, Atlantic City, N. J., June 29, 1953
Corporate Author: | |
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Format: | Book |
Language: | English |
Published: |
Philadelphia Ann Arbor, Mich.,
n.p., University Microfilms,
[1954; 1964]
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Series: | ASTM special technical publication ;
157 |
Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Duke University
Call Number: |
545.8 A512S |
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