Dielectric measurements using a reentrant cavity : mode-matching analysis /

Bibliographic Details
Main Author: Baker-Jarvis, James
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Riddle, Bill
Format: Government Document Book
Language:English
Published: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996
Series:NIST technical note ; 1384
Subjects:

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