Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems /
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| Format: | Government Document Book |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1997
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| Series: | NIST special publication ;
260-129 Standard reference materials |
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Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Duke University
| Call Number: |
C 13.10:260-129 |
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