International Symposium on Photoelectronic Detection and Imaging 2009. 17-19 June 2009, Beijing China / Advances in infrared imaging and applications

Bibliographic Details
Corporate Authors:	International Symposium on Photoelectronic Detection and Imaging (Corporate Author), International Symposium on Photoelectronic Detection and Imaging Beijing, China, China Aerospace Science and Industry Corporation Tianjin Jinhang Institute of Technical Physics (Content Provider), SPIE (Society) (Content Provider), Zhongguo yu hang xue hui Photoelectric Technology Professional Committee (Content Provider)
Other Authors:	Amzajerdian, Farzin (Contributor), Chen, Xu-yuan (Contributor), Gao, Chun-qing (Contributor), Puschell, Jeffery John (Contributor), Xie, Tian-yu (Contributor)
Format:	Conference Proceeding Book
Language:	English
Published:	[Place of publication not identified] SPIE 2009
Series:	Proceedings of SPIE International Symposium on Photoelectronic Detection and Imaging 2009 Proceedings of SPIE International Symposium on Photoelectronic Detection and Imaging 2009, laser sensing and imaging Proceedings of SPIE International Symposium on Photoelectronic Detection and Imaging 2009, material and device technology for sensors
Subjects:	Detectors > Congresses Detectors > Materials > Congresses Image processing > Congresses Imaging systems > Congresses Infrared detectors > Congresses Infrared imaging > Congresses Lasers > Congresses Optical detectors > Congresses Optical fiber detectors > Congresses Optoelectronic devices > Congresses Applied Physics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences

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