X-ray diffraction : modern experimental techniques /
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Singapore :
Pan Stanford Publishing,
[2015]
|
| Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Columbia University
| Call Number: |
EBOOKS |
|---|