Semiconductor reliability

Semiconductor reliability

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Bibliographic Details
Corporate Authors:	United States Advisory Group on Electron Tubes, Aerospace Industries Association of America, Conference on Reliability Assurance Techniques for Semiconductor Specifications, Conference on Reliability of Semiconductor Devices
Other Authors:	Shwop, John E (ed.), Shwop, John E. (Editor, http://id.loc.gov/vocabulary/relators/edt, ed), Von Alven, William H (ed.), Von Alven, William H. (Editor, http://id.loc.gov/vocabulary/relators/edt, ed)
Format:	Conference Proceeding Book
Language:	English
Published:	Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York, [1961-62] Elizabeth, N.J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961-62] Elizabeth, N.J., [1961-62]
Subjects:	Semiconductors > Reliability > Congresses Semiconductors Semiconductors > Reliability Conference papers and proceedings

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University of Chicago

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Call Number:	TK7872.S4S450

Massachusetts Institute of Technology

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Call Number:	TK7872.S4.S471

Cornell University

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Call Number:	TK7872.S4 C744 1961

Princeton University

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Call Number:	92956.853

Columbia University

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Call Number:	TK7872.S4 Se52

University of Pennsylvania

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Call Number:	621.3851 Se56

Brown University

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Call Number:	TK7871.85 .S45