Modeling electron transport and degradation mechanisms in semiconductor submicron devices /

Bibliographic Details
Main Author:	Goldsman, Neil, 1958-
Format:	Thesis Book
Language:	English
Published:	1989
Subjects:	Electron transport > Mathematical models Hot carriers > Mathematical models Semiconductors

Holdings details from Cornell University
Call Number:	Thesis 1989 G624 Thesis TK10 1989 G624

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