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Modeling electron transport an...
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Modeling electron transport and degradation mechanisms in semiconductor submicron devices /
Bibliographic Details
Main Author:
Goldsman, Neil, 1958-
Format:
Thesis
Book
Language:
English
Published:
1989
Subjects:
Electron transport
>
Mathematical models
Hot carriers
>
Mathematical models
Semiconductors
Holdings
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Cornell University
Holdings details from Cornell University
Call Number:
Thesis 1989 G624
Thesis TK10 1989 G624
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