Migration imaging of the transient electromagnetic method /

This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM...

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Bibliographic Details
Main Authors: Li, Xiu (Author), Xue, Guoqiang (Author), Yin, Changchun (Author)
Format: Book
Language:English
Chinese
Published: Singapore : Beijing, China : Springer ; Science Press, [2017]
Subjects:

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Stanford University

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Call Number: ISIL:US-CST